@article{33645,
  keywords = {Film growth, Crystal structure, Crystallography, Bismuth compounds, Ferroelectricity, Ferroelectric domain structure, Polarization direction, Piezoelectric force microscopy (PEM), Light polarization, In-plane piezoresponse, Cantilever beams},
  author = {F Zavaliche and R.R Das and D.M Kim and C.B Eom and S.Y Yang and P Shafer and Ramamoorthy Ramesh},
  title = {Ferroelectric domain structure in epitaxial BiFeO 3 films},
  abstract = {Piezoelectric force microscopy is employed to study the ferroelectric domain structure in a 600 nm thick epitaxial BiFe O3 film. In the as-grown film, a mosaic-like domain structure is observed. Scans taken with the cantilever pointing along the principal crystallographic directions enabled us to reconstruct the polarization direction. By combining the perpendicular and in-plane piezoresponse data, we found that the ferroelectric domain structure is mainly described by four polarization directions. These directions point oppositely along two body diagonals, which form an angle of ∼71°. The other variants are also occasionally observed. © 2005 American Institute of Physics.},
  year = {2005},
  journal = {Applied Physics Letters},
  volume = {87},
  number = {18},
  pages = {1-3},
  issn = {00036951},
  doi = {10.1063/1.2126804},
  note = {cited By 95},
  language = {eng},
}