@article{33641,
  keywords = {Thin films, Electron microscopy, Polarization, Epitaxial growth, Polarization switching, Bismuth compounds, Ferroelectricity, Strontium compounds, Ferroelectric domain structure, Piezoelectric force microscopy (PEM), Piezoresponse data, Vectors},
  author = {F Zavaliche and P Shafer and Ramamoorthy Ramesh and M.P Cruz and R.R Das and D.M Kim and C.B Eom},
  title = {Polarization switching in epitaxial BiFeO 3 films},
  abstract = {Ferroelectric domain structure and polarization switching in an epitaxial BiFe O3 film grown on a 0.8° miscut SrTi O3 (001) substrate were studied by piezoelectric force microscopy. The film shows a two-domain stripe pattern, with the polarization vectors oriented along two 〈111〉 axes which form an angle of 71°. Polarization switching was investigated by locally poling the film. By combining the perpendicular and in-plane piezoresponse data we found that polarization rotates by 71° and 109°, while 180° switching is mainly observed at low fields. © 2005 American Institute of Physics.},
  year = {2005},
  journal = {Applied Physics Letters},
  volume = {87},
  number = {25},
  pages = {1-3},
  issn = {00036951},
  doi = {10.1063/1.2149180},
  note = {cited By 102},
  language = {eng},
}