@article{33608,
  keywords = {transmission electron microscopy, crystal structure, Polarization, bismuth compounds, ferroelectricity, Ferroelectric films, Piezoforce microscopy, Epitaxial films, Ferroelectric size effects, Monoclinic phases},
  author = {Y.H Chu and T Zhao and M.P Cruz and Q Zhan and P.L Yang and L.W Martin and M Huijben and C.H Yang and F Zavaliche and H Zheng and Ramamoorthy Ramesh},
  title = {Ferroelectric size effects in multiferroic BiFeO3 thin films},
  abstract = {Ferroelectric size effects in multiferroic BiFeO3 have been studied using a host of complementary measurements. The structure of such epitaxial films has been investigated using atomic force microscopy, transmission electron microscopy, and x-ray diffraction. The crystal structure of the films has been identified as a monoclinic phase, which suggests that the polarization direction is close to (111). Such behavior has also been confirmed by piezoforce microscopy measurements. That also reveals that the ferroelectricity is down to at least 2 nm.©2007 American Institute of Physics.},
  year = {2007},
  journal = {Applied Physics Letters},
  volume = {90},
  number = {25},
  issn = {00036951},
  doi = {10.1063/1.2750524},
  note = {cited By 150},
  language = {eng},
}