@article{33600,
  keywords = {Domain walls, Bismuth compounds, Domain structure, Epitaxial films, Strain control, Stress concentration, Thermodynamic stability, Ferroelastic domain stability, Piezoelectric force microscopy (PEM)},
  author = {M.P Cruz and Y.H Chu and J.X Zhang and P.L Yang and F Zavaliche and Q He and P Shafer and L.Q Chen and Ramamoorthy Ramesh},
  title = {Strain control of domain-wall stability in epitaxial BiFeO3 (110) films},
  abstract = {We have studied the stability of domains and domain walls in multiferroic BiFeO3 thin films using a combination of piezoelectric force microscopy and phase-field simulations. We have discovered that a film-substrate misfit strain may result in a drastically different thermodynamic stability of two parallel domain walls with the same orientation. A fundamental understanding of the underlying physics, the stress distribution in a domain structure, leads to a novel approach to control the ferroelastic domain stability in the multiferroic BiFeO3 system. © 2007 The American Physical Society.},
  year = {2007},
  journal = {Physical Review Letters},
  volume = {99},
  number = {21},
  publisher = {American Physical Society},
  issn = {00319007},
  doi = {10.1103/PhysRevLett.99.217601},
  note = {cited By 87},
  language = {eng},
}