@article{33580,
  keywords = {Nanostructured materials, Hysteresis, Heterostructures, Domain walls, Ferroelectric materials, Multiferroic, Exchange bias, Ferroelectricity, Ferroelectric domains, X-ray crystallography, Dichroism, Coercive force, Cobalt, Magnetic domains, Semiconducting bismuth compounds, Domain structures, Nanoscale controls, Piezoresponse force microscopies, Magnetic thin films, Crystals, Coercive fields, Exchange enhancements, Large shifts, Nanoscale, X-ray magnetic circular dichroisms},
  author = {L.W Martin and Y.-H Chu and M.B Holcomb and M Huijben and P Yu and S.-J Han and D Lee and S.X Wang and Ramamoorthy Ramesh},
  title = {Nanoscale control of exchange bias with BiFeO 3 thin films},
  abstract = {We demonstrate a direct correlation between the domain structure of multiferroic BiFeO 3 thin films and exchange bias of Co 0.9Fe 0.1/BiFeO 3 heterostructures. Two distinct types of interactions - an enhancement of the coercive field (exchange enhancement) and an enhancement of the coercive field combined with large shifts of the hysteresis loop (exchange bias) - have been observed in these heterostructures, which depend directly on the type and crystallography of the nanoscale (∼2 nm) domain walls in the BiFeO 3 film. We show that the magnitude of the exchange bias interaction scales with the length of 109° ferroelectric domain walls in the BiFeO 3 thin films which have been probed via piezoresponse force microscopy and X-ray magnetic circular dichroism. © 2008 American Chemical Society.},
  year = {2008},
  journal = {Nano Letters},
  volume = {8},
  number = {7},
  pages = {2050-2055},
  issn = {15306984},
  doi = {10.1021/nl801391m},
  note = {cited By 231},
  language = {eng},
}