@inproceedings{33569,
  keywords = {Lead, Thin films, Zirconium, Ferroelectric materials, Ferroelectric films, Ferroelectric thin films, Coercive voltages, Do-mains, Nanodots, Retention properties},
  author = {N Balke and P Yu and L.-P Wang and Ramamoorthy Ramesh},
  title = {CH003: Stability of nanodots in ferroelectric thin films},
  abstract = {Retention properties of written nanodots for Pb(Zr0.2Ti 0.8)O3 have been investigated. The imaging voltage plays an important role when investigating small unstable domains. Even with an imaging voltage far below the coercive voltage the boundaries of the domains are switched during imaging by what the measured nanodomain stability is strongly influenced.},
  year = {2008},
  journal = {IEEE International Symposium on Applications of Ferroelectrics},
  volume = {1},
  isbn = {1424427444; 9781424427444},
  doi = {10.1109/ISAF.2008.4693909},
  note = {cited By 0},
  language = {eng},
}