@article{33494,
  keywords = {electricity, transmission electron microscopy, microscopy, oxide, oxides, electron, chemistry, Electric fields, Polarization, Article, scanning transmission electron microscopy, Scanning Transmission, Z-contrast imaging, Atomic displacement, Displacement profiles, Ferroelectric interface, Interface charge, Landau-Ginsburg-Devonshire theory, Real-space, STEM images},
  author = {H.J Chang and S.V Kalinin and A.N Morozovska and M Huijben and Y.-H Chu and P Yu and Ramamoorthy Ramesh and E.A Eliseev and G.S Svechnikov and S.J Pennycook and A.Y Borisevich},
  title = {Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging},
  abstract = {Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.},
  year = {2011},
  journal = {Advanced Materials},
  volume = {23},
  number = {21},
  pages = {2474-2479},
  issn = {09359648},
  doi = {10.1002/adma.201004641},
  note = {cited By 64},
  language = {eng},
}