@article{33491,
  keywords = {nucleation, transmission electron microscopy, in-situ, Electric fields, Multiferroics, Domain walls, Ferroelectric materials, polarization switching, ferroelectricity, Ferroelectric domains, scanning transmission electron microscopy, Multiferroic materials, Ferroelectric films, Ferroelastic domains, Scanning probes, Mesoscopics, Bottom electrodes, First-order, In-Situ Study, Local electric field, Nucleation and growth, Nucleation sites, Phase-field modeling, Scanning transmission electron microscopes, Spatially resolved, Conductive films, Scanning},
  author = {H Chang and S.V Kalinin and S Yang and P Yu and S Bhattacharya and P.P Wu and N Balke and S Jesse and L.Q Chen and Ramamoorthy Ramesh and S.J Pennycook and A.Y Borisevich},
  title = {Watching domains grow: In-situ studies of polarization switching by combined scanning probe and scanning transmission electron microscopy},
  abstract = {Ferroelectric domain nucleation and growth in multiferroic BiFeO 3 films is observed directly by applying a local electric field with a conductive tip inside a scanning transmission electron microscope. The nucleation and growth of a ferroelastic domain and its interaction with pre-existing 71° domain walls are observed and compared with the results of phase-field modeling. In particular, a preferential nucleation site and direction-dependent pinning of domain walls are observed due to slow kinetics of metastable switching in the sample without a bottom electrode. These in situ spatially resolved observations of a first-order bias-induced phase transition reveal the mesoscopic mechanisms underpinning functionality of a wide range of multiferroic materials. © 2011 American Institute of Physics.},
  year = {2011},
  journal = {Journal of Applied Physics},
  volume = {110},
  number = {5},
  issn = {00218979},
  doi = {10.1063/1.3623779},
  note = {cited By 41},
  language = {eng},
}