@article{25052,
  keywords = {Measurements, Measurement, Orientation, Copper, X-ray Diffraction, Film, Thin films, A-axis, Anisotropy, Bulk, Conductors, Copper oxide, Critical-field, Crystallites, Determination, Diffraction, Field, Fields, High-tc, Layers, Magnetic field, Magnetic field, Magnetoresistance, Microscopy, O superconducting films, Oriented, Oxide, P, Plane, Resistance, Resistivity, State, Superconductor, Texture, Time, X-Ray, X-ray Diffraction, Yba2cu3ox},
  author = {Paul H Berdahl and Xianglei Mao and Ronald P Reade and Michael D Rubin and Richard E Russo and E Yin},
  title = {Angular Magnetoresistance Provides Texture Information on High-Tc Conductors},
  abstract = {<p>Angular magnetoresistance measurements are performed by rotating a superconductor to an angle-theta in a fixed magnetic field, while monitoring the resistance R. It is argued theoretically that for fields well above the lower critical field, H much greater than H(cl), the bulk resistivity of the conductor is independent of theta if the crystallites of which it is composed are randomly oriented. Non-random orientation (a key aspect of texture) is revealed, therefore, by variations of R with theta. Dips in R indicate that the field is parallel to the copper oxide planes in a significant fraction of the current-carrying crystallites. C-axis, a-axis, and other textured film conductors are used to illustrate the technique. The angular magnetoresistance is found to be an important supplement to conventional texture determinations by microscopy and X-ray diffraction</p>},
  year = {1992},
  journal = {Physica C},
  volume = {195},
  pages = {93-102},
  note = {<p>LBNL-31513 NOT IN FILE</p>},
  language = {eng},
}