@inbook{25028,
  keywords = {thin films, characterization, film, films, material, raman, raman scattering, raman-scattering, scattering, thin, thin film, thin-film, thin-films},
  author = {Eric Faulques and Richard E Russo and Dale L Perry},
  title = {Characterization of High Temperature Superconductors with Raman Spectroscopy},
  year = {1992},
  journal = {Applications of Analytical Techniques to the Characterization of Materials},
  pages = {59-100},
  publisher = {Plenum Press},
  address = {New York},
  issn = {0-306-44189-6},
  language = {eng},
}